IONTOF M6 TOF-SIMS
The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. Ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research. The instrument includes:
M6 TOF Analyser: The revolutionary design of the extraction optics, the ion transfer and detection system provides an unmatched level of mass resolution, mass accuracy and transmission.
Nanoprobe 50: The Nanoprobe 50 is the latest generation bismuth cluster ion source for the M6. It provides highest beam currents and ultimate lateral resolutions down to 50 nm, guaranteed.
Key Features
- High lateral resolution (< 50 nm) with the Nanoprobe 50
- Mass resolution > 30,000
- Unique delayed extraction mode for high transmission with high lateral and high mass resolution simultaneously
- Unmatched dynamic range and detection limits
- TOF MS/MS with CID fragmentation for molecular structure elucidation
- Flexible, push-button, closed-loop sample heating and cooling system for long-term operation without user interaction
- Sophisticated SurfaceLab 7 software including fully integrated Multivariate Statistical Analysis (MVSA) software package
