Scanning Probe Microscopy

A Scanning Probe Microscope (SPM) is a versatile instrument that includes various sub-techniques, such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM).

These methods operate on the same basic principle: they generate an image line by line by moving a sharp probe across a surface and monitoring a distance-dependent physical parameter, such as interaction force, electrical current, or potential between the probe and the sample.

VSM Instruments offers SPM systems for ambient and Ultra-High Vacuum (UHV) conditions as well as a range of SPM probes and accessories and market-leading SPM control systems designed for third party SPM systems

 

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Scanning Probe Microscopy

A Scanning Probe Microscope (SPM) is a versatile instrument that includes various sub-techniques, such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM).

These methods operate on the same basic principle: they generate an image line by line by moving a sharp probe across a surface and monitoring a distance-dependent physical parameter, such as interaction force, electrical current, or potential between the probe and the sample.

VSM Instruments offers SPM systems for ambient and Ultra-High Vacuum (UHV) conditions as well as a range of SPM probes and accessories and market-leading SPM control systems designed for third party SPM systems

 

Key Features


  • Sub nm typical spatial resolution
  • Small samples <25mm are most regularly used, but some systems can accomodate large samples
  • Can be vacuum-based or in ambient conditions
  • Typical scan range <100 microns in X and Y, <20 microns in Z (smaller for vacuum-based systems)
  • At the most basic level, SPM systems give information on surface topography

AFM Probes and Accessories

VSM Instruments supplies a full range of unmounted  probes for AFM (Atomic Force Microscopy) with standard chip sizes suitable for most AFM systems including the systems from AFMWorkshop that we distribute. Our probes can be employed for a variety of imaging modes depending on their force constant, resonant frequency and coatings. For example soft, flexible probes are often chosen for contact mode imaging, while probes for oscillating modes such as semicontact, non-contact or tapping modes are often harder and with a higher resonant frequency. Those with conductive or magnetic coatings can be used for conductive or magnetic force modes.

In addition we also stock a full range of calibration samples suitable for scanning probe microscopy and standard, flat samples such as HOPG and Mica.

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Ambient SPM

AFM Performed in atmospheric (ambient) conditions has many advantages in terms of speed of measurement and the variety of samples which can be measured. Often ambient AFM systems offer a much wider variety of modes and a considerably larger scan range than their vacuum-based counterparts. This is at the expense of ultimate resolution, adsorption of water and other contaminants on the surface which can have some impact on the image. For many applications a vacuum environment is not practical and introduces considerable extra complexity to sample handling and user training.

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SPM Control Systems and Components

The Nanonis Mimea™ SPM control system is used for a wide range of applications ranging from tunneling microscopy and spectroscopy to SNOM, non-contact AFM, and special setups for more complex measurements. With the help of adaptation kits the control system adapts to any type of microscope, commercial or home-built. The systems have been used world-wide to produce results that made it to the cover pages of outstanding scientific journals. Reliability, user-friendliness and flexibility are the three principles which guide our development.
Our reliable and user-friendly control system for scanning probe microscopes gives you the freedom to focus on nanoscience without restrictions. Let us do the engineering and you enjoy doing science.

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Ultra High Vacuum SPM

Ultra High Vacuum(UHV) Scanning Probe Microscopy (SPM) has key advantages in terms of its spatial resolution, low temperature and magnetic field capabilities.  The UHV pressure range <<10-8mbar is achieved by baking the system to remove the residual water. As such the environment of the STM tip and the sample is able to stay free of contamination and unwanted adsorption more easily.

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Scanning Probe Microscopy

A Scanning Probe Microscope (SPM) is a versatile instrument that includes various sub-techniques, such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM).

These methods operate on the same basic principle: they generate an image line by line by moving a sharp probe across a surface and monitoring a distance-dependent physical parameter, such as interaction force, electrical current, or potential between the probe and the sample.

VSM Instruments offers SPM systems for ambient and Ultra-High Vacuum (UHV) conditions as well as a range of SPM probes and accessories and market-leading SPM control systems designed for third party SPM systems

 

Key Features


  • Sub nm typical spatial resolution
  • Small samples <25mm are most regularly used, but some systems can accomodate large samples
  • Can be vacuum-based or in ambient conditions
  • Typical scan range <100 microns in X and Y, <20 microns in Z (smaller for vacuum-based systems)
  • At the most basic level, SPM systems give information on surface topography

AFM Workshop HR High Resolution AFM

The HR Atomic Force Microscope (AFM) from AFM Workshop is an advanced yet affordable AFM for researchers that need the highest resolution scanning capabilities. Due to the 35 picometre noise floor, it is ideal for researchers that need to visualise and measure nanometre or sub-nanometre-sized surface features. The system includes two optical microscopes. From the top, the HR AFM has a research grade video optical microscope with a 7:1 mechanical zoom, a 5 MP camera, and a coaxial light. With a resolution of < 2 microns, this microscope is ideal for locating features on a surface for scanning. The side view video microscope has a 2 mp camera and an off axis LED light source. This camera is used for visualizing the distance between the probe and the sample. This microscope is especially helpful for assisting probe approach on clear samples as well as samples that don’t reflect light. The HR AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy.

Electronics in the HR AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimised with a 24-bit digital to analogue converter. With the analogue Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics. Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also allows the HR AFM to be readily combined with any other instrument using LabVIEW.

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AFM Workshop TT2 Table Top AFM

The TT-2 Atomic Force Microscope (AFM) from AFM Workshop is a versatile, high-resolution instrument designed for both educational and research purposes. This compact, second generation high resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a high quality video microscope with optical focus and zoom. The TT-2 AFM stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever of the AFM, locating surface features for scanning, and facilitating probe approach. The TT-2 AFM includes a high performance video optical microscope along with a 5 megapixel camera, light source, microscope stand, and Windows software for displaying images

The TT-2 AFM utilises a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy on the TT-2 AFM.

Electronics in the TT-2 AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimised with a 24-bit digital to analogue converter. With the analogue Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics. Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also allows the TT-2 AFM to be readily combined with any other instrument using LabVIEW.

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AFM Workshop NP Nanoprofiling AFM

Unlike the some of the other AFM Workshop systems, the NP Atomic Force Microscopy (AFM) is designed from the ground up for measurement of larger samples as large as 200 mm X 200 mm X 20 mm or multiple smaller samples. Its configuration is best suited to nanoprofiling applications for analysis of surface roughness and topography of larger samples such as wafers or multiple samples. Two different stages are available for the system. It can either be supplied with a large holder for 6 separate standard AFM magnetic disks, or vacuum chuck for wafers and flat samples up to 8″. The 8″ wafer stage is allows the full 8″ wafer to be addressed by the AFM probe via a two-tier coarse and fine sample positioning system. The system is based on tip scanning rather than sample scanning in some other AFM Workshop systems.

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AFM Workshop Stand Alone (SA) AFM

The Stand Alone SA AFM is a system designed in order to scan any size of sample without cutting the sample down, simply by placing the system on top of a surface. Since the probe extends below the stage structure, it would be possible, for example to place the system onto the surface of large objects to examine the surface coatings or finish at the nanoscale. The system is also equipped with an XY stage for translating smaller samples.

Use the SA-AFM for scanning large samples, routine scanning of technical samples, and for nanotechnology research. The SA-AFM is a complete system and includes everything required For scanning all sizes and shapes of samples.

Advanced Features:

  • Flexible, stand alone design
  • Scans any sample size
  • Linearized XY piezoelectric scanner
  • Accommodates widest range of standard AFM probes
  • All standard modes, including vibrating, non-vibrating, and phase
  • Direct drive motorised probe approach
  • Intuitive LabVIEW™-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.

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AFM Workshop Life Science (LS) AFM

Life Sciences AFM For soft-sample applications

The LS AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

LS AFM-A

For customers who already own an inverted optical microscope: In this configuration, AFMWorkshop fabricates a special plate that pairs the LS AFM with the customer’s existing inverted optical microscope.

LS AFM-B

This configuration of the LS AFM includes a fully-featured inverted optical microscope.

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AFM Workshop HR-2D AFM for 2D Materials / Glove Box

The HR-2D from AFM Workshop is a powerful, affordable and robust Atomic Force Microscopy (AFM) designed specifically for those imaging low dimensional and 2-D materials. It has a small footprint (18x18cm and 28cm high) and is easily accommodated in a glove box. The HR2D AFM includes a stage, control electronics, probes, manuals, and a high quality video microscope with optical focus and zoom. The HR-2D AFM stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever of the AFM, locating surface features for scanning, and facilitating probe approach. For viewing features on a sample’s surface, as well as facilitating probe approach, the HR-2D includes a high resolution video camera with a 5 MP CMOS camera. The camera support includes a focus mechanism with a 12 mm range.

The HR-2D AFM utilises a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy on the HR2D AFM.

The control system in the HR-2D AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimised with a 24-bit digital to analogue converter. With the analogue Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics. Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also allows the HR-2D AFM to be readily combined with any other instrument using LabVIEW.

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CreaTec Low Temperature STM / AFM System

The combined low-temperature scanning tunneling and atomic force microscope (LT-STM/AFM) is an essential part of CreaTec’s product range. In addition to its nanoanalytical capabilities, it allows the precise manipulation of atoms and molecules at
temperatures in the range of 4 to 300 K. The fully compatible low-temperature atomic force microscope (AFM) allows simultaneous measurements of force and tunneling current without cross-talk using constant frequency or constant height control.

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SPECS Nanonis Mimea 6th Generation

Newly-released in spring 2026, the 6th generation of the Nanonis control system builds the established pedigree of the Nanonis BP5e which has been the go-to solution for SPM control for the last 10 years. In total over 1600 Nanonis systems have been delivered to the research community since the Nanonis range was first launched over 20 years ago, serving as the technical foundation for countless scientific breakthroughs and high-impact publications. The Mimea 6th generations combines exceptional signal quality, high speed and a flexible, powerful and user-friendly software interface. The new controller builds on the exceptional performance and signal quality of the BP5 and offers 3 × reduction in broadband noise and a 8 × higher effective resolution compared to the previous generation, as well as a 7x higher data transfer rate.

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SPECS Nanonis OC6 Oscillation Controller

The oscillation controller (OC6) adds dynamic and multifrequency AFM capabilities to the Nanonis controller. With 5x the input bandwidth of the previous generation OC4 unit, the controller can handle signals from DC to 25 MHz or even 100MHz with the highest accuracy. The redesigned output signal path offers improved linearity, signal purity, and fully digital amplitude control. With user-selectable ranges and filters to reduce broadband noise and optimise signal quality for the application, it offers uncompromised performance also for signals down to DC. The high-current output stage can be bypassed for applications not requiring large driving currents, lowering noise to less than 5 nV/sqrt(Hz).

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SPECS Nanonis HVA4 High Voltage Amplifier

The HVA4 family is a set of high voltage amplifiers designed for nano-positioning applications using piezo elements. Three different models with maximum output voltages of ±140 V, ±220 V or ±400 V let the user choose an optimal setup for the required application. The unit has six channels featuring four inputs (X, Y, Z and AUX) divided into three groups (X&Y, Z, AUX). Each group has its individual gain selector with 4 settings. Z and AUX inputs additionally have switchable polarities.

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SPECS Nanonis HVS4 High Voltage Supply

Provides all the required supply voltages for the Nanonis HVA4 and PMD4. Up to two of these instruments can be connected to a single HVS4.

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SPECS Nanonis PMD4 Piezo Motor Driver

The Nanonis PMD4 piezo driver was specifically designed with low-temperature applications in mind, where slip-stick motors require very fast slip-transitions. The patented electronics of the PMD4 can provide waveforms with up to ±400V and deliver peak currents above 20 A. This results in fast transitions taking significantly less than 1 μs even at peak voltage into a real load. The very sharp transitions and high voltages also allow for simpler piezo stacks resulting in more rugged mechanical designs. The PMD4 can drive loads up to 3 μF.

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SPECS Nanonis adaptation kits

Nanonis adaptation kits exist for many commercially available UHV SPMs including those from SPECS themselves, as well as Omicron, RHK, JEOL, Unisoku and Bruker.

The original microscope cables connect directly to the pin-compatible interface, which makes it extremely simple to connect the control system to the microscope. The adaptation kit powers both STM and AFM pre-amplifiers and switches current and bias gains. In the case of beam deflection AFM models, the laser diode is monitored directly by the Nanonis software and the beam-deflection module displays the signals from the photo-detector. Control of inertial motors (x, y, z, mirrors and PSD) for coarse motion as well as automatic approach is seamlessly integrated in the Nanonis software and requires the Nanonis Piezo Motor Driver (PMD4).

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SPECS Nanonis Programming Interface Software Module

The power of lego blocks: Build a fully customized experiment in LabVIEW or any other programming language

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SPECS Nanonis Scripting Software Module

Script your own high-speed measurement sequences on the real-time system with scripting module SI 5. When speed and precise timing matter, measurement routines just can’t be fast enough. With a time-deterministic approach and 50 μs time interval between commands, scripting significantly boosts execution speed and reduces measurement time. The module is seamlessly integrated in standard measurement modules: Scripts can be easily called from other modules, and custom functions or pre-defined measurement can be started from within a script. The scripting module is not intended as a replacement of the Nanonis Programming Interface, but as complementary module: It allows 100x faster execution speed while the Programming Interface offers more flexibility.

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SPECS Nanonis Atom Tracking Software Module

The atom tracking module is designed to track topographical features (not only atoms) dynamically and can therefore measure and compensate for thermal drift and sample tilt. A fully automated procedure automatically calculates drift velocity and sample tilt in both X and Y-directions as well as drift in Z-direction and compensates for these. This module is of particular interest when the tip position has to follow a local extremum (e.g. an atom or molecule, maximum or minimum) between point-spectroscopy or when scanning a small scan area where drift is highly noticeable.

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SPECS SPM Aarhus 150

The SPM Aarhus 150 is an outstandingly stable and time saving instrument. A specially-designed variable temperature scanner platform of 3 kg mass with integrated low noise liquid nitrogen (LN2) cooling device guarantees the uncompromised superior SPM performance. Special care was taken to decouple the flow cooler from the sample stage and yet ensure permanent cooling connection between them. For this dedicated flexible copper braids are used to couple the extra heavy scanner platform to the flow cryostat without affecting excellent stability of the SPM Aarhus. A tight mechanical and thermal contact between sample holder and SPM stage allows for the extremely accurate sample temperature control and stability. A typical cool down times of less than 60 min to the temperatures below 130K are achieved. A typical time span of 20 min from insertion of a sample at room temperature to “ready for SPM” at below 130 K and has been shown. For temperature ramps counter heating of the sample is possible even to elevated temperatures up to 400 K. A comparably low LN2 consumption can be realized in operation as well as during the fast cool down of the cryostat from room temperature. About 20 l of LN2 is consumed during initial cool down while the typical LN2 consumption during operation at 130 K is about 10 litres per hour. Through the unification of the SPM mechanics into one STM/AFM unit, the SPM Aarhus 150 can easily be upgraded to AFM by using the KolibriSensor™. Our SPECS scanning probe microscope SPM Aarhus 150 sets a new standard by showing the highest thermal stability at variable temperatures between 90 and 400K without compromising its original mechanical stability. A direct in-situ optical access allows for the sample illumination and investigation of light induced processes. Additionally an evaporation port permits in-situ deposition on the sample surface and investigation of the growth processes during scanning.

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SPECS SPM150 Aarhus NAP

Investigations of catalytic reactions on the surfaces and the attempt to bridge the pressure and material gap between UHV and “real world” applications require an ultra-stable and reliable SPM able to operate in extreme conditions. Once again, the stability and simplicity of the SPM Aarhus design allowes for the extension of the applications in the pressure range between UHV and 100 mbar by developing special near ambient pressure (NAP) design. For this SPM Aarhus head is mounted in side of an in-situ reactor cell made of inert materials (or coated with non-reactive material). By doing so, only the inside of a little reactor cell is flooded with the gas. Easy and fast on-site switch between UHV and near ambient pressure applications is possible by opening a lid on top of the reactor cell. A halogen lamp heater for high temperature applications is mounted directly on the lid allowing all kinds of samples to be imaged at temperatures exceeding 850 K in UHV and 550K at 10 mbar. In-situ tip/sensor preparation by ion sputtering is still feasible when the lid of the reactor is open. A direct in-situ optical access to the sample during measurements at near ambient pressures can be used for investigation of photo catalytic reactions. Both STM tips as well as the KolibriSensor™ can be used with the system without any compromises on its stability.

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TNSU001 Polycrystalline Sapphire Substrates

Set of rectangular polycrystalline sapphire substrates suitable for scanning probe microscopy measurements.

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HOPG (Highly Oriented Pyrolytic Graphite)

Highly Oriented Pyrolytic Graphite (HOPG) is a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force microscopy (AFM) and scanning tunnelling microscopy and STM). It has a very smooth, flat surface and good electrical conductivity which make it particularly suitable for STM measurements.

HOPG substrates are particularly favoured due to their easy preparation as their layered structure allows a completely new, clean, smooth and conductive surface to be prepared by removing the topmost layers using sticky tape. HOPG itself is an interesting object for STM investigations. One can measure the surface roughness, microscopic surface features, arrangement of the carbon atoms on the HOPG surface, etc. HOPG images at the atomic level can also be used for calibrating STM for high-resolution imaging. HOPG is also a useful substrate for investigation of other materials which the user wishes to investigate by AFM or STM. The surface consists of many flat areas as well as randomly located steps. Single steps have a well-defined height of 0.34 nm and can be used for calibration.
z direction.

For use in STM the main HOPG parameters are the size of crystallites and the number of interlayer defects, which, in turn, defines the number of layers splitting of the sample. The mosaic distribution of crystallites doesn’t matter, so there is no sense to make measurement of FWHM that entails additional costs for selection and certification of the samples. HOPG can also be used in X-Ray or neutron monochromator applications, in which case the mosaic spread is of primary importance, so each crystal must be certified by FWHM measured on a diffractometer.

 

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Mica Substrates

Mica is a useful substrate for other materials, especially biological materials for scanning probe microscopy. It provides a hard, atomically flat semi transparent surface on which to perform experiments. Mica substrates are available in disks or squares in suitable sizes for use as substrates for most SPM systems.

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Lithium Niobate PFM Test Sample

This sample is designed to be used as a test for the Piezoresponse Force Microscopy (PFM) imaging mode. Lithium niobate (LiNbO3) single-crystalline 500-μm-thick plate with roughness less than 10 nm cut normal to the polar axis. A regular domain structure with period D is created in the sample. The spontaneous polarisation has the opposite direction in the neighboring domains. The polarisation direction determines the sign of piezoelectric coefficient. Analysis of the local piezoelectric response during application of the modulation voltage reveals the domain pattern.

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PMN-PT single crystal test sample for PFM

This product is intended as a test sample for Piezoresponse Force Microscopy (PFM). It is a single crystal of PMN-PT (lead magnesium niobate–lead titanate) with a defined 001 surface orientation. The sample is useful for selection of the optimal imaging parameters (phase and amplitude) in PFM mode and for making test measurements.

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TNSiC series Stepped Silicon Carbide Sample

This 6H-SiC(0001)-based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in subnanometre intervals. A straightforward calibration process is enabled by a nearly uniform distribution of half-monolayer high (0.75 nm) steps on the sample surface, demonstrating chemical and mechanical stability. The step height corresponds to the half of lattice constant of 6H-SiC crystal in [0001] direction.

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TNDG01 Sub Micron Calibration Grating

Calibration grating TNTDG01 is intended for AFM submicron calibration in X or Y direction. Period is 278nm.

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TNTG Series Single Calibration Gratings

A range of single gratings for calibrating different AFM axes on different length scales. Most of the gratings can also be purchased as part of a set which is often cheaper depending on user requirements. Please see product variation table for the different available options.

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TNTGS Series Calibration Grating Sets

A range of gratings for calibrating different AFM axes on different length scales sold in sets offering better value for money than single gratings. Most of the gratings can also be purchased as part of a set which is often cheaper depending on user requirements. Please see product variation table for the different available options.

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AFM Workshop B-3 AFM

The B-3 Atomic Force Microscope (AFM) is designed for educators who want to teach students about AFM operation and applications.

The B-3 AFM includes everything you need to start scanning: stage, computer, electronics, probes, and a reference standard. For a greater variety of applications and projects, it’s easy to add on options and modes at the time of purchase or at anytime in the future. The unique universal probe holder enables freedom in purchasing probes from the widest variety of vendors so as not to constrain your budget to expensive purchases from proprietary vendors.

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IONTOF M6 Plus: Combining TOF-SIMS and SPM in situ

The tool for nano characterisation
Information regarding the chemical composition, physical properties, and three-dimensional structure of materials and devices at the nanometre scale is crucial for new developments in nanoscience and nanotechnology. In a 3D SIMS measurement, the initial topography of the sample surface, as well as topographic changes during the experiment, cannot be easily identified. Scanning Probe Microscopy (SPM) provides complementary information about the surface topography and can also be used to measure the physical properties of the analysed sample.
Through the combination of these two techniques true in situ three-dimensional chemical imaging becomes possible. The M6 Plus platform combines the high-end performance of the M6 with the possibility to perform in situ SPM measurements. The large area SPM unit has a scan range of up to 80 x 80 x 10 µm3 and is ideally suited to provide topographic information for true 3D SIMS measurements.
Micrometre position accuracy
The piezo sample stage of the M6 Plus with sub-micron position accuracy ensures fast and precise movement between the TOF-SIMS and the SPM measurement position.
The stage has a 10 nm encoder resolution and travel speeds of up to 10 mm/s which guarantees a high level of precision and stability.
True 3D chemical imaging
Some samples have a strong initial surface topography which cannot be identified correctly with TOF-SIMS. By combining the chemical information of TOF-SIMS with the dimensional information of SPM a true three-dimensional chemical image can be generated.
Surface profiler mode
The SPM module of the M6 Plus also allows for detailed analysis of large sputter craters. In the so-called surface profiler mode multiple SPM scans are stitched together to measure long SPM line scans. This unique SPM mode is extremely valuable to precisely determine the depth of sputter craters or to measure crater roughness on the nanometre scale.
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TNCSG Series Contact Mode AFM probes

High Resolution Silicon AFM Cantilevers TNCSG series are designed for Contact Mode applications. The cantilever has a gold reflective coating on the top side to maximise the laser signal.

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TNNSG Series Semicontact Mode AFM probes

High Resolution Silicon AFM Cantilevers TNNSG series are designed for SemiContact (intermittent or non-contact) Mode applications. The cantilever has a gold reflective coating on the top side to maximise the laser signal.

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TNCSG Series Contact Mode AFM probes with Conductive Coating

High Resolution Silicon AFM Cantilevers TNCSG series are designed for electrical modes which operate with the probe in contact with the surface. The cantilever has a gold reflective coating on the top side to maximise the laser signal. Conductive coating on the tip side can be gold or platinum- iridium with a thickness of 20-30nm.

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DNA Test Sample

DNA01 is Plasmid pGem7zf+ (Promega) which is linearized with the SmaI endonuclease. A linear DNA molecules (3000 b. p.) are deposited onto freshly cleaved mica. Molecules are uniformly distributed on the surface with molecule density – 0.5-7 molec./um2 and typical DNA length 1009nm. Recommended humidity for obtaining a good image is 3-5%.

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TNNSG Series Semicontact Mode AFM probes with Conductive Coating

High Resolution Silicon AFM Cantilevers TNNSG series are designed for electrical modes which operate with the probe in intermittent contact with the surface. The cantilever has a gold reflective coating on the top side to maximise the laser signal. The conductive coating on the tip side can be gold or platinum- iridium with a thickness of 20-30nm

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TNMFM Series MFM probes with Magnetic Coating

High Resolution Silicon AFM Cantilevers TNMFM series are designed for magnetic modes such as magnetic force microscopy (MFM). The cantilever has an aluminium reflective coating on the top side to maximise the laser signal. The tip-side is coated with a CoCr magnetic coating.

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TNFMG Series Probes for Force Modulation Microscopy

High Resolution Silicon AFM Cantilevers TNFMG series are designed for force modulation applications. The cantilever has an aluminium reflective coating on the top side to maximise the laser signal. The tip-side is uncoated.

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TNVIT_P Top Visual Probes for Semicontact and Non-contact mode

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series are specially designed for tip or laser spot precise positioning over the point of interest. Typical Resonant Frequency 335 kHz (guaranteed range 210-490 kHz), Typical Force Constant 45 N/m (guaranteed range 12-110 N/m).  Cantilevers have no coating. Probes are also available with Au reflective coating as well as with conductive tip coating.

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TNVIT_P_C Top Visual Probes for Contact mode

TOP VISUAL High Resolution Contact Silicon AFM Cantilevers VIT_P_C series are specially designed for tip or laser spot precise positioning over the point of interest. Typical Resonant Frequency 16 kHz (guaranteed range 8-25 kHz), Typical Force Constant 0.3 N/m (guaranteed range 0.06-1N/m). Cantilevers don’t have any reflective coating.

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