TNVIT_P_C Top Visual Probes for Contact mode
TOP VISUAL High Resolution Contact Silicon AFM Cantilevers VIT_P_C series are specially designed for tip or laser spot precise positioning over the point of interest. Typical Resonant Frequency 16 kHz (guaranteed range 8-25 kHz), Typical Force Constant 0.3 N/m (guaranteed range 0.06-1N/m). Cantilevers don’t have any reflective coating.
Key Features
- Material: Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
- Chip size: 3.4×1.6×0.3mm
- Reflective side coating: No
- Tip coating: No
- Tip curvature radius: Typical 6nm, guaranteed 10nm
Please download the probes datasheet for more information on probe characteristics.
| Part No. | Resonant Frequency min/typical/max (kHz) | Force constant min/typical/max (Nm) | Probes in pack | Cantilever length +/-10um | Cantilever width +/-7.5um | Cantilever thickness +/-1um | |
|---|---|---|---|---|---|---|---|
| TNVIT_P_C/15 | 7/15/25 | 0.02/0.2/0.75 | 15 | 450 | 50 | 2.0 | |
| TNVIT_P_C/15 |
