AFM Probes and Accessories

VSM Instruments supplies a full range of unmounted  probes for AFM (Atomic Force Microscopy) with standard chip sizes suitable for most AFM systems including the systems from AFMWorkshop that we distribute. Our probes can be employed for a variety of imaging modes depending on their force constant, resonant frequency and coatings. For example soft, flexible probes are often chosen for contact mode imaging, while probes for oscillating modes such as semicontact, non-contact or tapping modes are often harder and with a higher resonant frequency. Those with conductive or magnetic coatings can be used for conductive or magnetic force modes.

In addition we also stock a full range of calibration samples suitable for scanning probe microscopy and standard, flat samples such as HOPG and Mica.

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AFM Probes and Accessories

VSM Instruments supplies a full range of unmounted  probes for AFM (Atomic Force Microscopy) with standard chip sizes suitable for most AFM systems including the systems from AFMWorkshop that we distribute. Our probes can be employed for a variety of imaging modes depending on their force constant, resonant frequency and coatings. For example soft, flexible probes are often chosen for contact mode imaging, while probes for oscillating modes such as semicontact, non-contact or tapping modes are often harder and with a higher resonant frequency. Those with conductive or magnetic coatings can be used for conductive or magnetic force modes.

In addition we also stock a full range of calibration samples suitable for scanning probe microscopy and standard, flat samples such as HOPG and Mica.

Key Features


Our range includes

  • AFM Probes for a variety of modes
  • AFM calibration samples optimised for a range of length scales and axes
  • Standard samples: Mica, Sapphire, HOPG
  • Test samples for specific modes or for high resolution imaging

AFM Probes (Cantilevers)

The probe or cantilever is one of the most important elements of an Atomic Force Microscope (AFM) system. It is the probe that makes the difference between an excellent quality image and one that is immediately destined for the recycle bin, and above all the correct choice of probe, alongside the imaging parameters is one of the most important areas of expertise for a scanning probe microscopist.

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Calibration Samples

To obtain the best performance and publication-quality data from your scanning probe microscope (SPM), it is necessary to calibrate the system regularly to ensure the scale of the images is correct in all three axes and the tip is sufficiently sharp to avoid artefacts. Our range of calibration gratings enables the user to do this regardless of the length scale they are working at.

Gratings may be purchased individually, or as a set for a reduced cost per grating for the best value for money.

 

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Substrates and Test Samples

VSM Instruments sells a variety of substrates suitable for making AFM test measurements, or as flat surfaces on which to deposit other materials under investigation. These include Highly Oriented Pyrolytic Graphite (HOPG), Mica, Sapphire and specific samples designed to test the ultimate resolution of the AFM or the performance under particular imaging modes.

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AFM Probes and Accessories

VSM Instruments supplies a full range of unmounted  probes for AFM (Atomic Force Microscopy) with standard chip sizes suitable for most AFM systems including the systems from AFMWorkshop that we distribute. Our probes can be employed for a variety of imaging modes depending on their force constant, resonant frequency and coatings. For example soft, flexible probes are often chosen for contact mode imaging, while probes for oscillating modes such as semicontact, non-contact or tapping modes are often harder and with a higher resonant frequency. Those with conductive or magnetic coatings can be used for conductive or magnetic force modes.

In addition we also stock a full range of calibration samples suitable for scanning probe microscopy and standard, flat samples such as HOPG and Mica.

Key Features


Our range includes

  • AFM Probes for a variety of modes
  • AFM calibration samples optimised for a range of length scales and axes
  • Standard samples: Mica, Sapphire, HOPG
  • Test samples for specific modes or for high resolution imaging

TNSU001 Polycrystalline Sapphire Substrates

Set of rectangular polycrystalline sapphire substrates suitable for scanning probe microscopy measurements.

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HOPG (Highly Oriented Pyrolytic Graphite)

Highly Oriented Pyrolytic Graphite (HOPG) is a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force microscopy (AFM) and scanning tunnelling microscopy and STM). It has a very smooth, flat surface and good electrical conductivity which make it particularly suitable for STM measurements.

HOPG substrates are particularly favoured due to their easy preparation as their layered structure allows a completely new, clean, smooth and conductive surface to be prepared by removing the topmost layers using sticky tape. HOPG itself is an interesting object for STM investigations. One can measure the surface roughness, microscopic surface features, arrangement of the carbon atoms on the HOPG surface, etc. HOPG images at the atomic level can also be used for calibrating STM for high-resolution imaging. HOPG is also a useful substrate for investigation of other materials which the user wishes to investigate by AFM or STM. The surface consists of many flat areas as well as randomly located steps. Single steps have a well-defined height of 0.34 nm and can be used for calibration.
z direction.

For use in STM the main HOPG parameters are the size of crystallites and the number of interlayer defects, which, in turn, defines the number of layers splitting of the sample. The mosaic distribution of crystallites doesn’t matter, so there is no sense to make measurement of FWHM that entails additional costs for selection and certification of the samples. HOPG can also be used in X-Ray or neutron monochromator applications, in which case the mosaic spread is of primary importance, so each crystal must be certified by FWHM measured on a diffractometer.

 

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Mica Substrates

Mica is a useful substrate for other materials, especially biological materials for scanning probe microscopy. It provides a hard, atomically flat semi transparent surface on which to perform experiments. Mica substrates are available in disks or squares in suitable sizes for use as substrates for most SPM systems.

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Lithium Niobate PFM Test Sample

This sample is designed to be used as a test for the Piezoresponse Force Microscopy (PFM) imaging mode. Lithium niobate (LiNbO3) single-crystalline 500-μm-thick plate with roughness less than 10 nm cut normal to the polar axis. A regular domain structure with period D is created in the sample. The spontaneous polarisation has the opposite direction in the neighboring domains. The polarisation direction determines the sign of piezoelectric coefficient. Analysis of the local piezoelectric response during application of the modulation voltage reveals the domain pattern.

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PMN-PT single crystal test sample for PFM

This product is intended as a test sample for Piezoresponse Force Microscopy (PFM). It is a single crystal of PMN-PT (lead magnesium niobate–lead titanate) with a defined 001 surface orientation. The sample is useful for selection of the optimal imaging parameters (phase and amplitude) in PFM mode and for making test measurements.

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TNSiC series Stepped Silicon Carbide Sample

This 6H-SiC(0001)-based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in subnanometre intervals. A straightforward calibration process is enabled by a nearly uniform distribution of half-monolayer high (0.75 nm) steps on the sample surface, demonstrating chemical and mechanical stability. The step height corresponds to the half of lattice constant of 6H-SiC crystal in [0001] direction.

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TNDG01 Sub Micron Calibration Grating

Calibration grating TNTDG01 is intended for AFM submicron calibration in X or Y direction. Period is 278nm.

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TNTG Series Single Calibration Gratings

A range of single gratings for calibrating different AFM axes on different length scales. Most of the gratings can also be purchased as part of a set which is often cheaper depending on user requirements. Please see product variation table for the different available options.

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TNTGS Series Calibration Grating Sets

A range of gratings for calibrating different AFM axes on different length scales sold in sets offering better value for money than single gratings. Most of the gratings can also be purchased as part of a set which is often cheaper depending on user requirements. Please see product variation table for the different available options.

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TNCSG Series Contact Mode AFM probes

High Resolution Silicon AFM Cantilevers TNCSG series are designed for Contact Mode applications. The cantilever has a gold reflective coating on the top side to maximise the laser signal.

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TNNSG Series Semicontact Mode AFM probes

High Resolution Silicon AFM Cantilevers TNNSG series are designed for SemiContact (intermittent or non-contact) Mode applications. The cantilever has a gold reflective coating on the top side to maximise the laser signal.

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TNCSG Series Contact Mode AFM probes with Conductive Coating

High Resolution Silicon AFM Cantilevers TNCSG series are designed for electrical modes which operate with the probe in contact with the surface. The cantilever has a gold reflective coating on the top side to maximise the laser signal. Conductive coating on the tip side can be gold or platinum- iridium with a thickness of 20-30nm.

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DNA Test Sample

DNA01 is Plasmid pGem7zf+ (Promega) which is linearized with the SmaI endonuclease. A linear DNA molecules (3000 b. p.) are deposited onto freshly cleaved mica. Molecules are uniformly distributed on the surface with molecule density – 0.5-7 molec./um2 and typical DNA length 1009nm. Recommended humidity for obtaining a good image is 3-5%.

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TNNSG Series Semicontact Mode AFM probes with Conductive Coating

High Resolution Silicon AFM Cantilevers TNNSG series are designed for electrical modes which operate with the probe in intermittent contact with the surface. The cantilever has a gold reflective coating on the top side to maximise the laser signal. The conductive coating on the tip side can be gold or platinum- iridium with a thickness of 20-30nm

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TNMFM Series MFM probes with Magnetic Coating

High Resolution Silicon AFM Cantilevers TNMFM series are designed for magnetic modes such as magnetic force microscopy (MFM). The cantilever has an aluminium reflective coating on the top side to maximise the laser signal. The tip-side is coated with a CoCr magnetic coating.

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TNFMG Series Probes for Force Modulation Microscopy

High Resolution Silicon AFM Cantilevers TNFMG series are designed for force modulation applications. The cantilever has an aluminium reflective coating on the top side to maximise the laser signal. The tip-side is uncoated.

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TNVIT_P Top Visual Probes for Semicontact and Non-contact mode

TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series are specially designed for tip or laser spot precise positioning over the point of interest. Typical Resonant Frequency 335 kHz (guaranteed range 210-490 kHz), Typical Force Constant 45 N/m (guaranteed range 12-110 N/m).  Cantilevers have no coating. Probes are also available with Au reflective coating as well as with conductive tip coating.

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TNVIT_P_C Top Visual Probes for Contact mode

TOP VISUAL High Resolution Contact Silicon AFM Cantilevers VIT_P_C series are specially designed for tip or laser spot precise positioning over the point of interest. Typical Resonant Frequency 16 kHz (guaranteed range 8-25 kHz), Typical Force Constant 0.3 N/m (guaranteed range 0.06-1N/m). Cantilevers don’t have any reflective coating.

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