TNDG01 Sub Micron Calibration Grating
Calibration grating TNTDG01 is intended for AFM submicron calibration in X or Y direction. Period is 278nm.
Key Features
| Structure | the grating is formed on the chalcogenide glass coated by Al |
| Pattern type | parallel ridges in X or Y direction, 1-Dimensional |
| Period | 278 ± 1 nm |
| Height | > 55 nm |
| Chip size | diameter 12.5 mm, thickness – 2.5 mm |
| Effective area | central diameter 9 mm |
