Calibration Samples

To obtain the best performance and publication-quality data from your scanning probe microscope (SPM), it is necessary to calibrate the system regularly to ensure the scale of the images is correct in all three axes and the tip is sufficiently sharp to avoid artefacts. Our range of calibration gratings enables the user to do this regardless of the length scale they are working at.

Gratings may be purchased individually, or as a set for a reduced cost per grating for the best value for money.

 

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Calibration Samples

To obtain the best performance and publication-quality data from your scanning probe microscope (SPM), it is necessary to calibrate the system regularly to ensure the scale of the images is correct in all three axes and the tip is sufficiently sharp to avoid artefacts. Our range of calibration gratings enables the user to do this regardless of the length scale they are working at.

Gratings may be purchased individually, or as a set for a reduced cost per grating for the best value for money.

 

Key Features


  • Lateral (XY) calibration
  • Z calibration at a variety of ranges
  • 3D calibration
  • Tip shape estimation
  • Sub-micron calibration

Calibration Samples

To obtain the best performance and publication-quality data from your scanning probe microscope (SPM), it is necessary to calibrate the system regularly to ensure the scale of the images is correct in all three axes and the tip is sufficiently sharp to avoid artefacts. Our range of calibration gratings enables the user to do this regardless of the length scale they are working at.

Gratings may be purchased individually, or as a set for a reduced cost per grating for the best value for money.

 

Key Features


  • Lateral (XY) calibration
  • Z calibration at a variety of ranges
  • 3D calibration
  • Tip shape estimation
  • Sub-micron calibration

TNSiC series Stepped Silicon Carbide Sample

This 6H-SiC(0001)-based calibration sample is designed to perform easy calibrations of AFM scanner vertical movement in subnanometre intervals. A straightforward calibration process is enabled by a nearly uniform distribution of half-monolayer high (0.75 nm) steps on the sample surface, demonstrating chemical and mechanical stability. The step height corresponds to the half of lattice constant of 6H-SiC crystal in [0001] direction.

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TNDG01 Sub Micron Calibration Grating

Calibration grating TNTDG01 is intended for AFM submicron calibration in X or Y direction. Period is 278nm.

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TNTG Series Single Calibration Gratings

A range of single gratings for calibrating different AFM axes on different length scales. Most of the gratings can also be purchased as part of a set which is often cheaper depending on user requirements. Please see product variation table for the different available options.

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TNTGS Series Calibration Grating Sets

A range of gratings for calibrating different AFM axes on different length scales sold in sets offering better value for money than single gratings. Most of the gratings can also be purchased as part of a set which is often cheaper depending on user requirements. Please see product variation table for the different available options.

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