TNVIT_P Top Visual Probes for Semicontact and Non-contact mode
TOP VISUAL High Resolution Semicontact / Noncontact Silicon AFM Cantilevers VIT_P series are specially designed for tip or laser spot precise positioning over the point of interest. Typical Resonant Frequency 335 kHz (guaranteed range 210-490 kHz), Typical Force Constant 45 N/m (guaranteed range 12-110 N/m). Cantilevers have no coating. Probes are also available with Au reflective coating as well as with conductive tip coating.
Key Features
- Material: Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
- Chip size: 3.4×1.6×0.3mm
- Reflective side coating: No
- Tip coating: No
- Tip curvature radius: Typical 6nm, guaranteed 10nm
- Available tip coatings: Pt
Please download the probes datasheet for more information on probe characteristics.
| Part No. | Resonant Frequency min/typical/max (kHz) | Force constant min/typical/max (Nm) | Probes in pack | Cantilever length +/-10um | Cantilever width +/-7.5um | Cantilever thickness +/-1um | |
|---|---|---|---|---|---|---|---|
| TNVIT_P/15 | 210/335/490 | 12/45/110 | 15 | 160 | 45 | 4.6 | |
| TNVIT_P/15 | |||||||
| TNVIT_P/50 | 210/335/490 | 12/45/110 | 50 | 160 | 45 | 4.6 | |
| TNVIT_P/50 |
