TNFMG Series Probes for Force Modulation Microscopy
High Resolution Silicon AFM Cantilevers TNFMG series are designed for force modulation applications. The cantilever has an aluminium reflective coating on the top side to maximise the laser signal. The tip-side is uncoated.
Key Features
- Material: Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
- Chip size: 3.4×1.6×0.3mm
- Reflective side coating: Al
- Tip coating: None
- Tip curvature radius: Typical 6nm, guaranteed 10nm
Please download the probes datasheet for more information on probe characteristics.
| Part No. | Resonant Frequency min/typical/max (kHz) | Force constant min/typical/max (Nm) | Probes in pack | Cantilever length +/-10um | Cantilever width +/-7.5um | Cantilever thickness +/-1um | |
|---|---|---|---|---|---|---|---|
| TNFMG01-A/15 | 45/75/115 | 0.5/2.8/9.5 | 15 | 225 | 28 | 3.0 | |
| TNFMG01-A/15 | |||||||
| TNFMG01-A/50 | 45/75/115 | 0.5/2.8/9.5 | 50 | 225 | 28 | 3.0 | |
| TNFMG01-A/50 |
