SPM Control Systems and Components

The Nanonis Mimea™ SPM control system is used for a wide range of applications ranging from tunneling microscopy and spectroscopy to SNOM, non-contact AFM, and special setups for more complex measurements. With the help of adaptation kits the control system adapts to any type of microscope, commercial or home-built. The systems have been used world-wide to produce results that made it to the cover pages of outstanding scientific journals. Reliability, user-friendliness and flexibility are the three principles which guide our development.
Our reliable and user-friendly control system for scanning probe microscopes gives you the freedom to focus on nanoscience without restrictions. Let us do the engineering and you enjoy doing science.

For more information

SPM Control Systems and Components

The Nanonis Mimea™ SPM control system is used for a wide range of applications ranging from tunneling microscopy and spectroscopy to SNOM, non-contact AFM, and special setups for more complex measurements. With the help of adaptation kits the control system adapts to any type of microscope, commercial or home-built. The systems have been used world-wide to produce results that made it to the cover pages of outstanding scientific journals. Reliability, user-friendliness and flexibility are the three principles which guide our development.
Our reliable and user-friendly control system for scanning probe microscopes gives you the freedom to focus on nanoscience without restrictions. Let us do the engineering and you enjoy doing science.

Key Features


The expandable engine for your SPM project

  • Fully asynchronous multitasking interface
  • State of the art hardware performance
  • Simple integration with almost any SPM
  • Interactive scan control with easy navigation
  • High-speed and multipass scanning, high-speed spectroscopy
  • Highly configurable Z-controller with SafeTipâ„¢
  • Oscilloscopes, spectrum analyzer (FFT), data loggers, charts and graphs
  • Advanced spectroscopy at user-defined point, line, cloud, grid or combined scan-grid.

 

SPM Control Systems and Components

The Nanonis Mimea™ SPM control system is used for a wide range of applications ranging from tunneling microscopy and spectroscopy to SNOM, non-contact AFM, and special setups for more complex measurements. With the help of adaptation kits the control system adapts to any type of microscope, commercial or home-built. The systems have been used world-wide to produce results that made it to the cover pages of outstanding scientific journals. Reliability, user-friendliness and flexibility are the three principles which guide our development.
Our reliable and user-friendly control system for scanning probe microscopes gives you the freedom to focus on nanoscience without restrictions. Let us do the engineering and you enjoy doing science.

Key Features


The expandable engine for your SPM project

  • Fully asynchronous multitasking interface
  • State of the art hardware performance
  • Simple integration with almost any SPM
  • Interactive scan control with easy navigation
  • High-speed and multipass scanning, high-speed spectroscopy
  • Highly configurable Z-controller with SafeTipâ„¢
  • Oscilloscopes, spectrum analyzer (FFT), data loggers, charts and graphs
  • Advanced spectroscopy at user-defined point, line, cloud, grid or combined scan-grid.

 

Newly-released in spring 2026, the 6th generation of the Nanonis control system builds the established pedigree of the Nanonis BP5e which has been the go-to solution for SPM control for the last 10 years. In total over 1600 Nanonis systems have been delivered to the research community since the Nanonis range was first launched over 20 years ago, serving as the technical foundation for countless scientific breakthroughs and high-impact publications. The Mimea 6th generations combines exceptional signal quality, high speed and a flexible, powerful and user-friendly software interface. The new controller builds on the exceptional performance and signal quality of the BP5 and offers 3 × reduction in broadband noise and a 8 × higher effective resolution compared to the previous generation, as well as a 7x higher data transfer rate.

The oscillation controller (OC6) adds dynamic and multifrequency AFM capabilities to the Nanonis controller. With 5x the input bandwidth of the previous generation OC4 unit, the controller can handle signals from DC to 25 MHz or even 100MHz with the highest accuracy. The redesigned output signal path offers improved linearity, signal purity, and fully digital amplitude control. With user-selectable ranges and filters to reduce broadband noise and optimise signal quality for the application, it offers uncompromised performance also for signals down to DC. The high-current output stage can be bypassed for applications not requiring large driving currents, lowering noise to less than 5 nV/sqrt(Hz).

The HVA4 family is a set of high voltage amplifiers designed for nano-positioning applications using piezo elements. Three different models with maximum output voltages of ±140 V, ±220 V or ±400 V let the user choose an optimal setup for the required application. The unit has six channels featuring four inputs (X, Y, Z and AUX) divided into three groups (X&Y, Z, AUX). Each group has its individual gain selector with 4 settings. Z and AUX inputs additionally have switchable polarities.

Provides all the required supply voltages for the Nanonis HVA4 and PMD4. Up to two of these instruments can be connected to a single HVS4.

The Nanonis PMD4 piezo driver was specifically designed with low-temperature applications in mind, where slip-stick motors require very fast slip-transitions. The patented electronics of the PMD4 can provide waveforms with up to ±400V and deliver peak currents above 20 A. This results in fast transitions taking significantly less than 1 μs even at peak voltage into a real load. The very sharp transitions and high voltages also allow for simpler piezo stacks resulting in more rugged mechanical designs. The PMD4 can drive loads up to 3 μF.

Nanonis adaptation kits exist for many commercially available UHV SPMs including those from SPECS themselves, as well as Omicron, RHK, JEOL, Unisoku and Bruker.

The original microscope cables connect directly to the pin-compatible interface, which makes it extremely simple to connect the control system to the microscope. The adaptation kit powers both STM and AFM pre-amplifiers and switches current and bias gains. In the case of beam deflection AFM models, the laser diode is monitored directly by the Nanonis software and the beam-deflection module displays the signals from the photo-detector. Control of inertial motors (x, y, z, mirrors and PSD) for coarse motion as well as automatic approach is seamlessly integrated in the Nanonis software and requires the Nanonis Piezo Motor Driver (PMD4).

The power of lego blocks: Build a fully customized experiment in LabVIEW or any other programming language

Script your own high-speed measurement sequences on the real-time system with scripting module SI 5. When speed and precise timing matter, measurement routines just can’t be fast enough. With a time-deterministic approach and 50 μs time interval between commands, scripting significantly boosts execution speed and reduces measurement time. The module is seamlessly integrated in standard measurement modules: Scripts can be easily called from other modules, and custom functions or pre-defined measurement can be started from within a script. The scripting module is not intended as a replacement of the Nanonis Programming Interface, but as complementary module: It allows 100x faster execution speed while the Programming Interface offers more flexibility.

The atom tracking module is designed to track topographical features (not only atoms) dynamically and can therefore measure and compensate for thermal drift and sample tilt. A fully automated procedure automatically calculates drift velocity and sample tilt in both X and Y-directions as well as drift in Z-direction and compensates for these. This module is of particular interest when the tip position has to follow a local extremum (e.g. an atom or molecule, maximum or minimum) between point-spectroscopy or when scanning a small scan area where drift is highly noticeable.