Ambient SPM

AFM Performed in atmospheric (ambient) conditions has many advantages in terms of speed of measurement and the variety of samples which can be measured. Often ambient AFM systems offer a much wider variety of modes and a considerably larger scan range than their vacuum-based counterparts. This is at the expense of ultimate resolution, adsorption of water and other contaminants on the surface which can have some impact on the image. For many applications a vacuum environment is not practical and introduces considerable extra complexity to sample handling and user training.

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Ambient SPM

AFM Performed in atmospheric (ambient) conditions has many advantages in terms of speed of measurement and the variety of samples which can be measured. Often ambient AFM systems offer a much wider variety of modes and a considerably larger scan range than their vacuum-based counterparts. This is at the expense of ultimate resolution, adsorption of water and other contaminants on the surface which can have some impact on the image. For many applications a vacuum environment is not practical and introduces considerable extra complexity to sample handling and user training.

Key Features


  • Large scan range
  • Sample flexibility
  • Large range of imaging modes and accessories
  • High throughput
  • Fast results

Ambient SPM

AFM Performed in atmospheric (ambient) conditions has many advantages in terms of speed of measurement and the variety of samples which can be measured. Often ambient AFM systems offer a much wider variety of modes and a considerably larger scan range than their vacuum-based counterparts. This is at the expense of ultimate resolution, adsorption of water and other contaminants on the surface which can have some impact on the image. For many applications a vacuum environment is not practical and introduces considerable extra complexity to sample handling and user training.

Key Features


  • Large scan range
  • Sample flexibility
  • Large range of imaging modes and accessories
  • High throughput
  • Fast results

AFM Workshop HR High Resolution AFM

The HR Atomic Force Microscope (AFM) from AFM Workshop is an advanced yet affordable AFM for researchers that need the highest resolution scanning capabilities. Due to the 35 picometre noise floor, it is ideal for researchers that need to visualise and measure nanometre or sub-nanometre-sized surface features. The system includes two optical microscopes. From the top, the HR AFM has a research grade video optical microscope with a 7:1 mechanical zoom, a 5 MP camera, and a coaxial light. With a resolution of < 2 microns, this microscope is ideal for locating features on a surface for scanning. The side view video microscope has a 2 mp camera and an off axis LED light source. This camera is used for visualizing the distance between the probe and the sample. This microscope is especially helpful for assisting probe approach on clear samples as well as samples that don’t reflect light. The HR AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy.

Electronics in the HR AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimised with a 24-bit digital to analogue converter. With the analogue Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics. Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also allows the HR AFM to be readily combined with any other instrument using LabVIEW.

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AFM Workshop TT2 Table Top AFM

The TT-2 Atomic Force Microscope (AFM) from AFM Workshop is a versatile, high-resolution instrument designed for both educational and research purposes. This compact, second generation high resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a high quality video microscope with optical focus and zoom. The TT-2 AFM stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever of the AFM, locating surface features for scanning, and facilitating probe approach. The TT-2 AFM includes a high performance video optical microscope along with a 5 megapixel camera, light source, microscope stand, and Windows software for displaying images

The TT-2 AFM utilises a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy on the TT-2 AFM.

Electronics in the TT-2 AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimised with a 24-bit digital to analogue converter. With the analogue Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics. Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also allows the TT-2 AFM to be readily combined with any other instrument using LabVIEW.

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AFM Workshop NP Nanoprofiling AFM

Unlike the some of the other AFM Workshop systems, the NP Atomic Force Microscopy (AFM) is designed from the ground up for measurement of larger samples as large as 200 mm X 200 mm X 20 mm or multiple smaller samples. Its configuration is best suited to nanoprofiling applications for analysis of surface roughness and topography of larger samples such as wafers or multiple samples. Two different stages are available for the system. It can either be supplied with a large holder for 6 separate standard AFM magnetic disks, or vacuum chuck for wafers and flat samples up to 8″. The 8″ wafer stage is allows the full 8″ wafer to be addressed by the AFM probe via a two-tier coarse and fine sample positioning system. The system is based on tip scanning rather than sample scanning in some other AFM Workshop systems.

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AFM Workshop Stand Alone (SA) AFM

The Stand Alone SA AFM is a system designed in order to scan any size of sample without cutting the sample down, simply by placing the system on top of a surface. Since the probe extends below the stage structure, it would be possible, for example to place the system onto the surface of large objects to examine the surface coatings or finish at the nanoscale. The system is also equipped with an XY stage for translating smaller samples.

Use the SA-AFM for scanning large samples, routine scanning of technical samples, and for nanotechnology research. The SA-AFM is a complete system and includes everything required For scanning all sizes and shapes of samples.

Advanced Features:

  • Flexible, stand alone design
  • Scans any sample size
  • Linearized XY piezoelectric scanner
  • Accommodates widest range of standard AFM probes
  • All standard modes, including vibrating, non-vibrating, and phase
  • Direct drive motorised probe approach
  • Intuitive LabVIEW™-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.

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AFM Workshop Life Science (LS) AFM

Life Sciences AFM For soft-sample applications

The LS AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

LS AFM-A

For customers who already own an inverted optical microscope: In this configuration, AFMWorkshop fabricates a special plate that pairs the LS AFM with the customer’s existing inverted optical microscope.

LS AFM-B

This configuration of the LS AFM includes a fully-featured inverted optical microscope.

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AFM Workshop HR-2D AFM for 2D Materials / Glove Box

The HR-2D from AFM Workshop is a powerful, affordable and robust Atomic Force Microscopy (AFM) designed specifically for those imaging low dimensional and 2-D materials. It has a small footprint (18x18cm and 28cm high) and is easily accommodated in a glove box. The HR2D AFM includes a stage, control electronics, probes, manuals, and a high quality video microscope with optical focus and zoom. The HR-2D AFM stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever of the AFM, locating surface features for scanning, and facilitating probe approach. For viewing features on a sample’s surface, as well as facilitating probe approach, the HR-2D includes a high resolution video camera with a 5 MP CMOS camera. The camera support includes a focus mechanism with a 12 mm range.

The HR-2D AFM utilises a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy on the HR2D AFM.

The control system in the HR-2D AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimised with a 24-bit digital to analogue converter. With the analogue Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics. Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also allows the HR-2D AFM to be readily combined with any other instrument using LabVIEW.

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AFM Workshop B-3 AFM

The B-3 Atomic Force Microscope (AFM) is designed for educators who want to teach students about AFM operation and applications.

The B-3 AFM includes everything you need to start scanning: stage, computer, electronics, probes, and a reference standard. For a greater variety of applications and projects, it’s easy to add on options and modes at the time of purchase or at anytime in the future. The unique universal probe holder enables freedom in purchasing probes from the widest variety of vendors so as not to constrain your budget to expensive purchases from proprietary vendors.

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