AFM Workshop TT2 Table Top AFM

The TT-2 Atomic Force Microscope (AFM) from AFM Workshop is a versatile, high-resolution instrument designed for both educational and research purposes. This compact, second generation high resolution tabletop Atomic Force Microscope (AFM) has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a high quality video microscope with optical focus and zoom. The TT-2 AFM stage has excellent thermal and mechanical stability required for high resolution AFM scanning. Additionally, its open design facilitates user modification.

A video optical microscope in an AFM serves three functions: aligning the laser onto the cantilever in the light lever of the AFM, locating surface features for scanning, and facilitating probe approach. The TT-2 AFM includes a high performance video optical microscope along with a 5 megapixel camera, light source, microscope stand, and Windows software for displaying images

The TT-2 AFM utilises a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy on the TT-2 AFM.

Electronics in the TT-2 AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimised with a 24-bit digital to analogue converter. With the analogue Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics. Software for acquiring images is designed with the industry standard LabVIEWâ„¢ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEWâ„¢ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also allows the TT-2 AFM to be readily combined with any other instrument using LabVIEW.

Key Features


Sample Sizes: Up to 1″ X 1″ X 3/4″  (~25x25mm x 19 mm thick)
Standard Scanning Modes: Vibrating (Tapping), Non-Vibrating (Contact), Phase, LFM, F/D
Scanners: 100 X 100 X 17 µm, 50 X 50 X17 µm, 15 X 15 X 7 µm
Video Optical Microscope: Zoom to 400X, 2 µm resolution
Stage and EBox Size: Compact table top design