AFM Workshop HR High Resolution AFM

The HR Atomic Force Microscope (AFM) from AFM Workshop is an advanced yet affordable AFM for researchers that need the highest resolution scanning capabilities. Due to the 35 picometre noise floor, it is ideal for researchers that need to visualise and measure nanometre or sub-nanometre-sized surface features. The system includes two optical microscopes. From the top, the HR AFM has a research grade video optical microscope with a 7:1 mechanical zoom, a 5 MP camera, and a coaxial light. With a resolution of < 2 microns, this microscope is ideal for locating features on a surface for scanning. The side view video microscope has a 2 mp camera and an off axis LED light source. This camera is used for visualizing the distance between the probe and the sample. This microscope is especially helpful for assisting probe approach on clear samples as well as samples that don’t reflect light. The HR AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy.

Electronics in the HR AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimised with a 24-bit digital to analogue converter. With the analogue Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics. Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also allows the HR AFM to be readily combined with any other instrument using LabVIEW.