AFM Workshop B-3 AFM

The B-3 Atomic Force Microscope (AFM) is designed for educators who want to teach students about AFM operation and applications.

The B-3 AFM includes everything you need to start scanning: stage, computer, electronics, probes, and a reference standard. For a greater variety of applications and projects, it’s easy to add on options and modes at the time of purchase or at anytime in the future. The unique universal probe holder enables freedom in purchasing probes from the widest variety of vendors so as not to constrain your budget to expensive purchases from proprietary vendors.

Key Features


Key Features and Benefits of the B-3 AFM

Control Software The B-3 AFM includes the full featured and powerful AFMControl package used in our advanced products. Images created with the B-3 AFM are compatible with the free image processing software Gwyddion.
Training Videos Included with the B-3 AFM are training videos that guide new users through the steps required to measure images.
Education Samples AFMWorkshop maintains a list of samples that are useful for training student about AFMs and Nanotechnology. Applications range from biology to materials science.
Intuitive Light Lever Design The light lever’s unique design makes aligning the system a routine procedure for users with limited AFM experience. A removable probe holder makes changing probes quick and easy.
Linearized X, Y, and Z Scanners Piezoelectric X, Y (50 µm) and Z (17 µm) scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.
Video Optical Microscope
5 MP Video Camera, 200 X
Sample Sizes
25 mm x 25 mm x 12 mm
Standard AFM Scanning Modes Scanning modes for the B-3 AFM include vibrating (tapping), non-vibrating (contact), phase, and LFM (Force/Distance). These modes allow users to scan the most common types of samples.
Acoustic Enclosure The B-3 AFM is encased in an acoustic cabinet made from ¾” MDF and acoustic foam, creating a vibration isolation environment that provides high-quality scans on almost any lab bench.

Applications

Education The B-3 AFM is ideal for educating students on the theory, operation, and applications of an atomic force microscope. One of the advantages of the B-3 AFM for education is the open design of the light lever force sensor.
Routine Scanning For customers with routine scanning applications, the B-3 AFM is an ideal product. It has a noise floor < 0.2 nm and with an optional vibration isolation table it has a noise floor < 0.08 nm.*