CreaTec Low Temperature STM / AFM System

The combined low-temperature scanning tunneling and atomic force microscope (LT-STM/AFM) is an essential part of CreaTec’s product range. In addition to its nanoanalytical capabilities, it allows the precise manipulation of atoms and molecules at
temperatures in the range of 4 to 300 K. The fully compatible low-temperature atomic force microscope (AFM) allows simultaneous measurements of force and tunneling current without cross-talk using constant frequency or constant height control.

Key Features


  • Combined MBE growth and LT-STM/AFM analysis
  • Compact multi-chamber design
  • High quality surface preparation and fast reliable transfer
  • Optimised for highest resolution, state-of-the-art LT-STM and AFM measurements without cross-talk
  • Base temperature LT-STM/AFM < 5 K
  • Lowest LN2 and LHe consumption
  • Designed for long-term low-temperature spectroscopy and atom manipulation
  • Lowest drift, highest stability
  • Best cost performance ratio
  • Short support time

Multiple options

  • Magnetic field
  • Optical access allowing laser excitation and photoluminescence experiments
  • High frequency cabling
  • 1 K bath cryostat

Powerful software package

  • Large number of high resolution A/D and D/A channels (10)
  • Fully open OLE/COM interface and document file format
  • Internal lock-in amplifier included as a standard
  • Special spectra on grid module included as standard