IONTOF M6 Hybrid SIMS
With the OrbitrapTMÂ extension for the M6, IONTOF provides the first commercial SIMS instrument which combines the highest mass resolution (> 240,000) and highest mass accuracy (< 1 ppm) with high resolution cluster SIMS imaging.
The combination of the fast imaging capabilities of the TOF analyser with the unique performance of the OrbitrapTMÂ for unambiguous peak identification provides a new level of SIMS information from organic samples.
The instrument extension also provides field-proven, high-end MS/MS capabilities and sets a benchmark for high resolution molecular SIMS applications.
The combination of the fast imaging capabilities of the TOF analyser with the unique performance of the OrbitrapTMÂ for unambiguous peak identification provides a new level of SIMS information from organic samples.
The instrument extension also provides field-proven, high-end MS/MS capabilities and sets a benchmark for high resolution molecular SIMS applications.
The powerful combination of the gas cluster ion source and the OrbitrapTMÂ analyser enables the distinction of different features even in highly complex organic samples.
Key Features
- Dual analyser configuration with TOF and OrbitrapTM analysers
- High resolution gas cluster imaging and spectrometry beyond the static SIMS limit
- Mass resolution > 240,000 and < 1 ppm mass accuracy
- High resolution MS/MS capabilities
