Biomaterials

Biomaterials are at the heart of modern medical technologies, from implants and tissue scaffolds to drug delivery systems and biosensors. Since biological function is governed by surface interactions, advanced surface analysis techniques are essential for designing, evaluating, and optimising material performance in biological environments. Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS), Hybrid TOF-SIMS with Orbitrap mass spectrometry, and Atomic Force Microscopy (AFM) provide complementary, high-resolution insights into the chemistry, molecular structure, and nanoscale topography of biomaterial surfaces.

NAP-XPS enables chemical analysis of biomaterial surfaces under near-physiological conditions, including the presence of moisture and biological media. This makes it especially suited for studying protein adsorption, cell adhesion, and surface modifications that influence biocompatibility and functionality. Because it operates under near-ambient conditions, NAP-XPS preserves native chemical states and allows researchers to probe real-time biological interactions at the solid–liquid interface.

Hybrid TOF-SIMS, enhanced with a high-resolution Orbitrap analyser, provides detailed molecular imaging and mass spectrometry of biological and polymeric surfaces. This technique is capable of detecting and mapping lipids, peptides, pharmaceutical agents, and other biomolecules with submicron spatial resolution and excellent mass accuracy. It is particularly valuable in tissue engineering, implant surface analysis, and drug delivery research where complex surface chemistries are involved.

AFM adds a crucial layer of nanoscale insight by mapping surface topography, mechanical properties, and interaction forces with sub-nanometre resolution. In life sciences and biomaterials research, AFM can visualise soft tissues, polymer coatings, and live cells without requiring conductive coatings or harsh vacuum environments. It allows researchers to study how materials interact with biological systems at the mechanical level, such as stiffness, adhesion, and surface texture—which are critical factors in cell behaviour and implant integration.

NAP-XPS, Hybrid TOF-SIMS, and AFM are complimentary methods of investigating and engineering next-generation biomaterials that interface effectively with the human body.

Relevant products

With the OrbitrapTM extension for the M6, IONTOF provides the first commercial SIMS instrument which combines the highest mass resolution (> 240,000) and highest mass accuracy (< 1 ppm) with high resolution cluster SIMS imaging.
The combination of the fast imaging capabilities of the TOF analyser with the unique performance of the OrbitrapTM for unambiguous peak identification provides a new level of SIMS information from organic samples.
The instrument extension also provides field-proven, high-end MS/MS capabilities and sets a benchmark for high resolution molecular SIMS applications.
The powerful combination of the gas cluster ion source and the OrbitrapTM analyser enables the distinction of different features even in highly complex organic samples.

The AtomTrace SciTrace is a modular instrument designed from the ground up for high quality Laser Induced Breakdown Spectroscopy (LIBS) Measurements. The instrument can either be configured as a vacuum-based instrument, or as a simple open “cage” chamber where the sample is measured under ambient conditions. The vacuum body provides protection against laser reflections and potentially toxic ablated materials. All windows are covered with laser filters. The system can easily be configured to house multiple lasers all pointing at the sample target for multiple / double pulsed LIBS in order to enhance the detection limits.

This novel and smart analysis tool overcomes the barriers of standard XPS systems by enabling analyses at pressures far above UHV. EnviroESCA is designed from the ground up for high-throughput analysis and opens up new applications in the fields of medical technology, biotechnology and the life sciences.

It offers the shortest loading-to-measurement time on samples of all types including liquids, tissue, plastics and foils, powders, soil, zeolites, rocks, minerals and ceramics

The SPECS ProvenX NAP is available with backfilling configuration or with In-Situ Cell (DeviSIM, like a small compact reactor). It is a performance optimised system for state of the art NAP-XPS as well as NAP-UPS measurements from UHV up to 30 mbar pressure range. It contains a PHOIBOS 150 NAP analyser with unsurpassed transmission and angular acceptance, a high performance small spot monochromatic X-ray source µ-FOCUS 600 NAP, a 4-axes manipulator or DeviSIM with NAP different heating capabilities as well as an optional non-monochromatic UV source UVS 300 NAP.

Life Sciences AFM For soft-sample applications

The LS AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

LS AFM-A

For customers who already own an inverted optical microscope: In this configuration, AFMWorkshop fabricates a special plate that pairs the LS AFM with the customer’s existing inverted optical microscope.

LS AFM-B

This configuration of the LS AFM includes a fully-featured inverted optical microscope.

Highest transmission wide angle hemispherical energy analyser with 60° acceptance angle, and AD-CMOS detector for photo electron spectroscopy measurements (XPS and UPS) and angular resolved studies (ARXPS) in the pressure regime from UHV to near ambient pressure (NAP upgradable). With this analyser NAP-HAXPES measurements up to 10 keV can be performed.

This small spot source is equipped with Al anode in the standard configuration and two upgradable higher energies anodes (Ag, and Cr) for HAXPES capabilities. The µFOCUS 450 monochromator together with the XR-MC micro-focus X-ray source is perfectly suited for small spot, high resolution, and high intensity XPS measurements. The X-ray monochromator operates according to Bragg’s Law of X-ray diffraction. Each wavelength of X-rays (Al Kα, Ag Lα, Cr Kα) is reflected from individually optimized crystals at a specific angle of reflection. For the Al and Ag anodes, quartz crystal are used, which have a 450 mm and 416 mm Rowland circle diameter respectively , whereas for Cr germanium crystals are used with a 676 mm Rowland circle. Due to its overall compactness, the µFOCUS 450 is suitable for mounting on almost any analysis chambers as a bolt-on component. Furthermore, being already equipped with a Si3N4 window, by using the differentially pumped NAP extension, the µFOCUS 450 allows to carry out XPS measurements under gas atmospheres of up to 50 mbar.

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