Corrosion

Corrosion affects critical infrastructure across industries from transportation and energy, to construction and marine systems. Understanding the chemical mechanisms driving corrosion at the surface level is essential for developing more durable materials and protective coatings. Surface analysis tools like Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS) offer cutting-edge capabilities for observing corrosion processes in real-world environments.

NAP-XPS, offered by SPECS Surface Nano Analysis, is uniquely equipped to study corrosion under near-operando conditions. Traditional XPS systems require ultra-high vacuum, which can alter the chemical state of corroded or hydrated surfaces. In contrast, NAP-XPS allows for high-resolution chemical analysis in the presence of gases, humidity, and (critically) liquids. Using specialised liquid cells, researchers can directly probe the solid–liquid interface, capturing real-time information about the interaction between corrosive environments (e.g., saline solutions or acidic electrolytes) and metal or alloy surfaces under a controlled atmosphere.

This capability makes NAP-XPS particularly powerful for corrosion science, as it enables the in situ observation of oxidation, passivation, pitting initiation, and inhibitor performance. Whether studying pipeline materials, marine coatings, or advanced alloys, NAP-XPS provides detailed information on surface chemistry and environmental interactions. Such insights are critical for developing corrosion-resistant solutions.

NAP-XPS brings together surface sensitivity, chemical specificity, and environmental flexibility, making it an invaluable tool for corrosion research in academia, industrial R&D, and materials testing laboratories.

Relevant products

IONTOF M6 TOF-SIMS

The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. Ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research. The instrument includes:

M6 TOF Analyser: The revolutionary design of the extraction optics, the ion transfer and detection system provides an unmatched level of mass resolution, mass accuracy and transmission.

Nanoprobe 50: The Nanoprobe 50 is the latest generation bismuth cluster ion source for the M6. It provides highest beam currents and ultimate lateral resolutions down to 50 nm, guaranteed.

 

 

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EnviroESCA

This novel and smart analysis tool overcomes the barriers of standard XPS systems by enabling analyses at pressures far above UHV. EnviroESCA is designed from the ground up for high-throughput analysis and opens up new applications in the fields of medical technology, biotechnology and the life sciences.

It offers the shortest loading-to-measurement time on samples of all types including liquids, tissue, plastics and foils, powders, soil, zeolites, rocks, minerals and ceramics

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ProvenX NAP

The SPECS ProvenX NAP is available with backfilling configuration or with In-Situ Cell (DeviSIM, like a small compact reactor). It is a performance optimised system for state of the art NAP-XPS as well as NAP-UPS measurements from UHV up to 30 mbar pressure range. It contains a PHOIBOS 150 NAP analyser with unsurpassed transmission and angular acceptance, a high performance small spot monochromatic X-ray source µ-FOCUS 600 NAP, a 4-axes manipulator or DeviSIM with NAP different heating capabilities as well as an optional non-monochromatic UV source UVS 300 NAP.

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AEOLOS 150 Analyser

Highest transmission wide angle hemispherical energy analyser with 60° acceptance angle, and AD-CMOS detector for photo electron spectroscopy measurements (XPS and UPS) and angular resolved studies (ARXPS) in the pressure regime from UHV to near ambient pressure (NAP upgradable). With this analyser NAP-HAXPES measurements up to 10 keV can be performed.

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µFOCUS 450

This small spot source is equipped with Al anode in the standard configuration and two upgradable higher energies anodes (Ag, and Cr) for HAXPES capabilities. The µFOCUS 450 monochromator together with the XR-MC micro-focus X-ray source is perfectly suited for small spot, high resolution, and high intensity XPS measurements. The X-ray monochromator operates according to Bragg’s Law of X-ray diffraction. Each wavelength of X-rays (Al Kα, Ag Lα, Cr Kα) is reflected from individually optimized crystals at a specific angle of reflection. For the Al and Ag anodes, quartz crystal are used, which have a 450 mm and 416 mm Rowland circle diameter respectively , whereas for Cr germanium crystals are used with a 676 mm Rowland circle. Due to its overall compactness, the µFOCUS 450 is suitable for mounting on almost any analysis chambers as a bolt-on component. Furthermore, being already equipped with a Si3N4 window, by using the differentially pumped NAP extension, the µFOCUS 450 allows to carry out XPS measurements under gas atmospheres of up to 50 mbar.

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