AFM Workshop Stand Alone (SA) AFM

The Stand Alone SA AFM is a system designed in order to scan any size of sample without cutting the sample down, simply by placing the system on top of a surface. Since the probe extends below the stage structure, it would be possible, for example to place the system onto the surface of large objects to examine the surface coatings or finish at the nanoscale. The system is also equipped with an XY stage for translating smaller samples.

Use the SA-AFM for scanning large samples, routine scanning of technical samples, and for nanotechnology research. The SA-AFM is a complete system and includes everything required For scanning all sizes and shapes of samples.

Advanced Features:

• Flexible, stand alone design
• Scans any sample size
• Linearized XY piezoelectric scanner
• Accommodates widest range of standard AFM probes
• All standard modes, including vibrating, non-vibrating, and phase
• Direct drive motorised probe approach
• Intuitive LabVIEW™-based software for image capture

Using the industry standard light lever force sensor, all standard scanning modes are included with the system. Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Control software, written in LabVIEW, is simple and intuitive to use. Differing windows walk users through the process: a pre-scan window helps align the AFM probe, a scanning window aids in acquiring images, a force position window measures force distance curves, and finally, a system window assists in altering system parameters.