Catalysis

Catalysis plays a central role in energy conversion, chemical manufacturing, and environmental remediation. Understanding catalytic processes at the atomic and molecular level, especially under working conditions, is essential for designing more efficient, selective, and stable catalysts. Surface analytical methods such as Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS) and Low Energy Ion Scattering (LEIS) offer powerful insights into catalyst surfaces, the reactions, and active sites in ways that traditional techniques cannot.

NAP-XPS, offered by SPECS, enables the real-time chemical analysis of catalytic surfaces in the presence of reactive gases and at elevated pressures. This allows researchers to study catalysts under near-operando conditions, revealing dynamic changes in oxidation states, adsorbates, and reaction intermediates. From heterogeneous catalysis in energy systems to industrial processes like COâ‚‚ reduction or ammonia synthesis, NAP-XPS makes it possible to observe the surface chemistry of functional materials as reactions happen, helping to close the pressure gap between UHV studies and real-world catalytic environments.

Low Energy Ion Scattering (LEIS), offered by IONTOF, provides unique access to the elemental composition of just the outermost atomic layer of a catalyst. This ultra-surface-specific technique can be applied in order to identify the active species on supported nanoparticles, alloy surfaces, or promoter-modified materials. LEIS can precisely track how surface composition evolves during activation, reaction, or degradation, offering quantitative insight into structure–activity relationships at the true reactive interface.

Together, NAP-XPS and LEIS offer a complementary and comprehensive approach to catalytic surface analysis. These advanced tools empower scientists in academic, industrial, and energy research environments to engineer catalysts with improved performance, lower material costs, and longer operational lifetimes

Relevant products

This novel and smart analysis tool overcomes the barriers of standard XPS systems by enabling analyses at pressures far above UHV. EnviroESCA is designed from the ground up for high-throughput analysis and opens up new applications in the fields of medical technology, biotechnology and the life sciences.

It offers the shortest loading-to-measurement time on samples of all types including liquids, tissue, plastics and foils, powders, soil, zeolites, rocks, minerals and ceramics

The SPECS ProvenX NAP is available with backfilling configuration or with In-Situ Cell (DeviSIM, like a small compact reactor). It is a performance optimised system for state of the art NAP-XPS as well as NAP-UPS measurements from UHV up to 30 mbar pressure range. It contains a PHOIBOS 150 NAP analyser with unsurpassed transmission and angular acceptance, a high performance small spot monochromatic X-ray source µ-FOCUS 600 NAP, a 4-axes manipulator or DeviSIM with NAP different heating capabilities as well as an optional non-monochromatic UV source UVS 300 NAP.

The Qtac is a high sensitivity Low Energy Ion Scattering (LEIS) instrument. It is extremely surface-sensitive, providing quantitative elemental characterisation of the top atomic layer.

This instrument has been developed to include small spot analysis, surface imaging, and both static and dynamic depth profiling.

Its unique surface sensitivity makes the Qtac the perfect tool to study surface processes. The Qtac provides valuable information in many production and research areas on materials such as catalysts, semiconductors, metals, polymers, and fuel cells.

Highest transmission wide angle hemispherical energy analyser with 60° acceptance angle, and AD-CMOS detector for photo electron spectroscopy measurements (XPS and UPS) and angular resolved studies (ARXPS) in the pressure regime from UHV to near ambient pressure (NAP upgradable). With this analyser NAP-HAXPES measurements up to 10 keV can be performed.

This small spot source is equipped with Al anode in the standard configuration and two upgradable higher energies anodes (Ag, and Cr) for HAXPES capabilities. The µFOCUS 450 monochromator together with the XR-MC micro-focus X-ray source is perfectly suited for small spot, high resolution, and high intensity XPS measurements. The X-ray monochromator operates according to Bragg’s Law of X-ray diffraction. Each wavelength of X-rays (Al Kα, Ag Lα, Cr Kα) is reflected from individually optimized crystals at a specific angle of reflection. For the Al and Ag anodes, quartz crystal are used, which have a 450 mm and 416 mm Rowland circle diameter respectively , whereas for Cr germanium crystals are used with a 676 mm Rowland circle. Due to its overall compactness, the µFOCUS 450 is suitable for mounting on almost any analysis chambers as a bolt-on component. Furthermore, being already equipped with a Si3N4 window, by using the differentially pumped NAP extension, the µFOCUS 450 allows to carry out XPS measurements under gas atmospheres of up to 50 mbar.

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