Pharmaceuticals

Surface chemistry plays a critical role in the development and performance of pharmaceutical products, from drug delivery systems to coated tablets and biomedical devices. Advanced analytical methods are essential for understanding surface composition, contamination, and molecular distribution at the microscale and nanoscale.

Hybrid TOF-SIMS combines the proven strengths of Time-of-Flight Secondary Ion Mass Spectrometry with the high mass accuracy and resolving power of an integrated Orbitrap™ analyser. This hybrid system is especially powerful in pharmaceutical applications where precise molecular identification is crucial. It enables label-free imaging of active pharmaceutical ingredients (APIs), excipients, and contaminants—delivering high-resolution chemical maps of tablet coatings, formulations, or microstructures. Its sensitivity to both inorganic and organic species allows researchers to study drug distribution, degradation products, and trace-level impurities with unmatched clarity.

In addition to TOF-SIMS, other complementary techniques provide valuable insights. Laser-Induced Breakdown Spectroscopy (LIBS) offers rapid, multi-elemental analysis and is ideal for detecting elemental contaminants or ensuring uniformity across coatings and bulk materials. X-ray Photoelectron Spectroscopy (XPS) gives detailed chemical state information, useful for studying surface oxidation, binding interactions, and formulation stability. Meanwhile, Atomic Force Microscopy (AFM) provides nanoscale surface topography and mechanical property measurements, important for understanding tablet roughness, coating integrity, or interactions with biological tissues.

Together, these surface analytical tools enable comprehensive material characterisation throughout the pharmaceutical lifecycle, from research and development to quality assurance and failure analysis. Whether improving formulation design or ensuring regulatory compliance, they help deliver safer, more effective pharmaceutical products.

Relevant products

With the OrbitrapTM extension for the M6, IONTOF provides the first commercial SIMS instrument which combines the highest mass resolution (> 240,000) and highest mass accuracy (< 1 ppm) with high resolution cluster SIMS imaging.
The combination of the fast imaging capabilities of the TOF analyser with the unique performance of the OrbitrapTM for unambiguous peak identification provides a new level of SIMS information from organic samples.
The instrument extension also provides field-proven, high-end MS/MS capabilities and sets a benchmark for high resolution molecular SIMS applications.
The powerful combination of the gas cluster ion source and the OrbitrapTM analyser enables the distinction of different features even in highly complex organic samples.

The AtomTrace SciTrace is a modular instrument designed from the ground up for high quality Laser Induced Breakdown Spectroscopy (LIBS) Measurements. The instrument can either be configured as a vacuum-based instrument, or as a simple open “cage” chamber where the sample is measured under ambient conditions. The vacuum body provides protection against laser reflections and potentially toxic ablated materials. All windows are covered with laser filters. The system can easily be configured to house multiple lasers all pointing at the sample target for multiple / double pulsed LIBS in order to enhance the detection limits.

This novel and smart analysis tool overcomes the barriers of standard XPS systems by enabling analyses at pressures far above UHV. EnviroESCA is designed from the ground up for high-throughput analysis and opens up new applications in the fields of medical technology, biotechnology and the life sciences.

It offers the shortest loading-to-measurement time on samples of all types including liquids, tissue, plastics and foils, powders, soil, zeolites, rocks, minerals and ceramics

The SPECS ProvenX NAP is available with backfilling configuration or with In-Situ Cell (DeviSIM, like a small compact reactor). It is a performance optimised system for state of the art NAP-XPS as well as NAP-UPS measurements from UHV up to 30 mbar pressure range. It contains a PHOIBOS 150 NAP analyser with unsurpassed transmission and angular acceptance, a high performance small spot monochromatic X-ray source µ-FOCUS 600 NAP, a 4-axes manipulator or DeviSIM with NAP different heating capabilities as well as an optional non-monochromatic UV source UVS 300 NAP.

Life Sciences AFM For soft-sample applications

The LS AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

LS AFM-A

For customers who already own an inverted optical microscope: In this configuration, AFMWorkshop fabricates a special plate that pairs the LS AFM with the customer’s existing inverted optical microscope.

LS AFM-B

This configuration of the LS AFM includes a fully-featured inverted optical microscope.

Highest transmission wide angle hemispherical energy analyser with 60° acceptance angle, and AD-CMOS detector for photo electron spectroscopy measurements (XPS and UPS) and angular resolved studies (ARXPS) in the pressure regime from UHV to near ambient pressure (NAP upgradable). With this analyser NAP-HAXPES measurements up to 10 keV can be performed.

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