Low Energy Electron Diffraction (LEED) with optional Auger Electron Spectroscopy (AES)

Low Energy Electron Diffraction (LEED) is one of the most powerful methods to determine surface structures. Analysis of LEED patterns and intensities provides the size and shape of the surface unit cell, the degree of order and detailed atomic structure with a precision of the order of picometers. Our LEED optics also enable Auger Electron Spectroscopy (AES) when equipped with the appropriate (optional) control unit. AES is a technique to provide chemical analysis of the surface. Our LEED optics are available in two flange sizes, DN100CF and DN150CF. We recommend the largest possible flange size if the chamber allows it, as larger screen sizes much are easier to work with and the cost saving for the smaller optics is minimal.

Key Features


  • Flange size DN100CF or DN150CF
  • Retraction mechanism 50 or 100mm (optionally fixed – please ask)
  • Option for 3 or 4 grids (3 grids recommended for LEED only, 4 grids for LEED/Auger)
  • Standard filament thoriated iridium, optionally LaB6 (please ask). The former more flexible for operation pressure, the latter better in UHV conditions for higher current, longevity, work function. LaB6 are more expensive than thoriated iridium
  • Optional camera system, mounting system and software (please ask)

Please download the brochure for more information

Part No.Flange sizeCapability# GridsShutter
SP0018200218DN100CFLEED only3No
SP0018200218+
SP0018200219DN100CFLEED only3Yes
SP0018200219+
SP0018200214DN150CFLEED only3No
SP0018200214+
SP0018200215DN150CFLEED only3Yes
SP0018200215+
SP0018200220DN100CFLEED Auger4No
SP0018200220+
SP0018200221DN100CFLEED Auger4Yes
SP0018200221+
SP0018200216DN150CFLEED Auger4No
SP0018200216+
SP0018200217DN150CFLEED Auger4Yes
SP0018200217+

SP0018200218

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SP0018200219

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SP0018200214

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SP0018200215

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SP0018200220

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SP0018200221

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SP0018200216

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SP0018200217

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