Proven X-MM Proven Analysis System for Momentum Microscopy

The ProvenX-MM system is a specialized system base for momentum microscopy solutions, supporting the KREIOS 150 Series, parallel single event detectors and optional spin detection, as well as the UVS µFOCAL small spot UV source with optional monochromator. The sample handling is done by the SPECS HESTIA low temperature microscopy stage. The system comes with a dedicated preparation chamber, a clean UHV sample storage facility and a multi sample fast entry loadlock.

System control is done by the SpecsLab Prodigy software suite with integrated remote control packages, automated sample handling and a computer based vacuum control system.

The system can be equipped with an optional small spot x-ray source for material characterisation. Additional software and preparation tools are available.

SPECS

Key Features


  • High Resolution Momentum Microscope
  • Low Temperature Sample Stage
  • Monochromated Small Spot UV Source
  • Reliable and Proven System Design
  • Optional Small Spot Monochromated XPS Imaging Function
  • Fully Automated System Control
  • Including Preparation Chamber, Loadlock and Sample Storage
ProvenX-MM
Performance
Energy Resolution < 10 meV (< 5 meV achievable) with KREIOS 150
< 25 meV with KREIOS 150 MM
k-Resolution < 0.008 Å-1 with KREIOS Series
Acceptance Angle < 3.6 Å-1 / ±90° with KREIOS Series
Sample Temperature < 9 K with HESTIA Sample Stage
Spot Size < 100 µm UV Spot Size with UVS µFOCAL
< 250 µm X-Ray Spot Size with µFOCUS 500
Residual Magnetic Field < 0.5 µT in Analysis Chamber
Base Pressure < 2×10-10 mbar in Analysis and Preparation Chamber
< 5×10-8 mbar in Load Lock
Configuration
Electron Energy Analyser SPECS KREIOS 150 Electron Momentum Spectrometer
SPECS KREIOS 150 MM Momentum Microscope
SPECS KREIOS 150 MM Twin Momentum Microscope
Detector 2D-CMOS True Parallel Pulse Counting Detector

optional:
3D Spin Detector with VLEED or MOTT Detection Scheme
Direct Imaging Spin Detector with KREIOS 150 MM
Analysis Chamber spherical µ-metal chamber
Manipulator HESTIA Sample Stage
Preparation Chamber Stainless Steel Preparation Chamber
Options: LEED, Surface Cleaning, Plasma Treatment, Deposition Sources
Load Lock Fast Entry Load Lock with Sample Storage for 4 Samples
UV Source SPECS UVS with µFOCAL capillary and optional TMM 304 UV Monochromator
Hg Discharge Light Source
X-Ray Source SPECS µFOCUS 500 X-Ray Monochromator with Al kα Anode
Sample Storage 4 Slots in Analysis Chamber and 4 Slots in Loadlock Chamber
Vacuum Control SPECS Vacuum Control Software for Full Vacuum System Automation
Operating Software SpecsLab Prodigy Control Software
Proven X-MM Proven Analysis System for Momentum Microscopy

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