Turn-key probing platform (4 probe)

This compact table-top Probe Station is designed for micro-scale electrical characterisation of semiconductor dies and test devices under 1’’. It drives up to 4 miBot probers and connects their probe tips to third-party electrical source-measurement units. A high-magnification microscope with motorised zoom and a manual X-Y stage for sample positioning are included in this turnkey solution.

Imina Technologies
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Key Features


  • Integral microscope (1.1um resolution) and camera (1920×1200 pixels) with motorised zoom
  • Manual sample stage with 10x10mm movement range
  • Space for up to 4 miBot™ micro probers
Turn-key probing platform (4 probe)

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