TNCSG Series Contact Mode AFM probes
High Resolution Silicon AFM Cantilevers TNCSG series are designed for Contact Mode applications. The cantilever has a gold reflective coating on the top side to maximise the laser signal.
Key Features
- Material: Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
- Chip size: 3.4×1.6×0.3mm
- Reflective side coating: Au
- Tip coating: None
- Tip curvature radius: Typical 6nm, guaranteed 10nm
Please download the probes datasheet for more information on probe characteristics
| Part No. | Force constant min/typical/max (Nm) | Resonant Frequency min/typical/max (kHz) | Probes in pack | Cantilever length +/-10um | Cantilever width +/-5um | Cantilever thickness +/-1um | |
|---|---|---|---|---|---|---|---|
| TNCSG01/15 | 0.003/0.03/0.13 | 4/9.8/17 | 15 | 450 | 47.5 | 1.25 | |
| TNCSG01/15 | |||||||
| TNCSG01/50 | 0.003/0.03/0.13 | 4/9.8/17 | 50 | 450 | 47.5 | 1.25 | |
| TNCSG01/50 | |||||||
| TNCSG10/15 | 0.01/0.11/0.5 | 8/22/39 | 15 | 225 | 47.5 | 1.25 | |
| TNCSG10/15 | |||||||
| TNCSG10/50 | 0.01/0.11/0.5 | 8/22/39 | 50 | 225 | 47.5 | 1.25 | |
| TNCSG10/50 | |||||||
| TNCSG30/50 | 0.13/0.6/2 | 26/48/76 | 50 | 225 | 25 | 2 | |
| TNCSG30/50 |
