Glass

Glass is an important material in industries ranging from electronics and optics to architecture and biomedical devices. Understanding its surface composition, structure, and morphology is essential for improving durability, functionality, and performance. Surface analytical techniques such as TOF-SIMS, LIBS, and AFM provide the resolution and sensitivity needed to study glass at the micro- and nanoscale.

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a powerful tool for analysing the chemical composition of glass surfaces and sub-surfaces with exceptional sensitivity. It is especially well suited as the pulsed ion beam interacts well with insulating materials.  It enables depth profiling of multi-layered glass structures, detection of trace impurities, and identification of contaminants. This makes it especially valuable in the production of specialty and functional glass used in displays, solar panels, and microelectronics. When used in combination with sputter depth profiling, TOF-SIMS provides high-resolution three-dimensional chemical imaging of dopants, coatings, and surface treatments.

Laser-Induced Breakdown Spectroscopy (LIBS) offers rapid, real-time elemental analysis of glass surfaces and bulk. Its minimal sample preparation and adaptability to in-line or field use make it ideal for quality control in glass manufacturing, recycling, and environmental monitoring.

Meanwhile, Atomic Force Microscopy (AFM) allows researchers to visualise and quantify nanoscale surface roughness, etching patterns, and defects on glass surfaces. AFM is particularly useful in evaluating the effects of chemical treatments, coatings, or polishing processes, helping to optimise optical clarity, adhesion, and durability. Together, these techniques support innovation in the design, processing, and application of advanced glass materials.

Relevant products

IONTOF M6 TOF-SIMS

The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. Ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research. The instrument includes:

M6 TOF Analyser: The revolutionary design of the extraction optics, the ion transfer and detection system provides an unmatched level of mass resolution, mass accuracy and transmission.

Nanoprobe 50: The Nanoprobe 50 is the latest generation bismuth cluster ion source for the M6. It provides highest beam currents and ultimate lateral resolutions down to 50 nm, guaranteed.

 

 

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EnviroMETROS

EnviroMETROS is a unique metrology platform for the chemical analysis of ultrathin films and 2D materials that allows a detailed characterisation of stoichiometries‚ composition and depth distribution of elements. The system combines XPS with an array of optional techniques such as HAXPES, UPS, IPES, AES, REELS, Raman and Infrared spectroscopies. These techniques can be employed on the same sample spot. It can optionally be configured for NAP XPS, but the base model is a UHV load-locked system. Depending on the system configuration, it can be set up for 80x80mm samples or 8″ or 12″ wafers.

 

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AFM Workshop HR High Resolution AFM

The HR Atomic Force Microscope (AFM) from AFM Workshop is an advanced yet affordable AFM for researchers that need the highest resolution scanning capabilities. Due to the 35 picometre noise floor, it is ideal for researchers that need to visualise and measure nanometre or sub-nanometre-sized surface features. The system includes two optical microscopes. From the top, the HR AFM has a research grade video optical microscope with a 7:1 mechanical zoom, a 5 MP camera, and a coaxial light. With a resolution of < 2 microns, this microscope is ideal for locating features on a surface for scanning. The side view video microscope has a 2 mp camera and an off axis LED light source. This camera is used for visualizing the distance between the probe and the sample. This microscope is especially helpful for assisting probe approach on clear samples as well as samples that don’t reflect light. The HR AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy.

Electronics in the HR AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimised with a 24-bit digital to analogue converter. With the analogue Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics. Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also allows the HR AFM to be readily combined with any other instrument using LabVIEW.

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AtomTrace Sci-Trace

The AtomTrace SciTrace is a modular instrument designed from the ground up for high quality Laser Induced Breakdown Spectroscopy (LIBS) Measurements. The instrument can either be configured as a vacuum-based instrument, or as a simple open “cage” chamber where the sample is measured under ambient conditions. The vacuum body provides protection against laser reflections and potentially toxic ablated materials. All windows are covered with laser filters. The system can easily be configured to house multiple lasers all pointing at the sample target for multiple / double pulsed LIBS in order to enhance the detection limits.

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AtomTrace M-Trace

The M-Trace is a truly portable solution for Laser Induced Breakdown Spectroscopy (LIBS). Easily transportable by car for in-the-field analysis, the system is an all in one solution for fast, non-destructive chemical analysis. The system can be powered by batteries and weighs less than 30Kg. It uses a class 1 laser so requires no additional laser safety.

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EnviroESCA

This novel and smart analysis tool overcomes the barriers of standard XPS systems by enabling analyses at pressures far above UHV. EnviroESCA is designed from the ground up for high-throughput analysis and opens up new applications in the fields of medical technology, biotechnology and the life sciences.

It offers the shortest loading-to-measurement time on samples of all types including liquids, tissue, plastics and foils, powders, soil, zeolites, rocks, minerals and ceramics

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AEOLOS 150 Analyser

Highest transmission wide angle hemispherical energy analyser with 60° acceptance angle, and AD-CMOS detector for photo electron spectroscopy measurements (XPS and UPS) and angular resolved studies (ARXPS) in the pressure regime from UHV to near ambient pressure (NAP upgradable). With this analyser NAP-HAXPES measurements up to 10 keV can be performed.

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