Polymers

Polymers are integral to industries ranging from packaging and automotive to medical devices and electronics. Their complex chemical structures, surface modifications, and sensitivity to environmental factors make surface analysis a key tool in polymer research, processing, and quality control. Techniques like TOF-SIMS, Near Ambient Pressure XPS (NAP-XPS), AFM, and LIBS enable comprehensive, multi-dimensional insights into polymer surfaces and interfaces.

TOF-SIMS, offered by IONTOF, is especially powerful for polymer characterisation due to its high mass range and advanced argon cluster ion sources. These allow for sensitive detection of high molecular weight fragments and large organic species without excessive fragmentation, ideal for identifying additives, contaminants, and degradation products in complex polymer blends. TOF-SIMS also enables high-resolution molecular imaging, providing detailed chemical maps of coatings, films, and interfaces in multilayer systems.

NAP-XPS, from SPECS complements TOF-SIMS by offering chemical state information with minimal sample alteration. Polymers are typically insulating and often hydrated or porous, conditions that challenge traditional ultra-high vacuum techniques. NAP-XPS overcomes this with native charge compensation and operation under controlled, near-ambient conditions, making it suitable for analysing real-world polymer surfaces, including those exposed to air, humidity, or biological media.

Atomic Force Microscopy (AFM) adds further insight, offering nanometre-scale topographical and mechanical property measurements. It is particularly useful for evaluating surface roughness, phase separation, and material elasticity, which affect adhesion, wettability, and functional performance. Meanwhile, Laser-Induced Breakdown Spectroscopy (LIBS) can provide fast, in situ elemental analysis across large polymer components or composite materials, making it suitable for rapid screening or process monitoring.

Together, these advanced surface analysis tools give researchers and manufacturers a complete picture of polymer surface chemistry, structure, and performance.

Relevant products

IONTOF M6 TOF-SIMS

The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. Ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research. The instrument includes:

M6 TOF Analyser: The revolutionary design of the extraction optics, the ion transfer and detection system provides an unmatched level of mass resolution, mass accuracy and transmission.

Nanoprobe 50: The Nanoprobe 50 is the latest generation bismuth cluster ion source for the M6. It provides highest beam currents and ultimate lateral resolutions down to 50 nm, guaranteed.

 

 

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AFM Workshop HR High Resolution AFM

The HR Atomic Force Microscope (AFM) from AFM Workshop is an advanced yet affordable AFM for researchers that need the highest resolution scanning capabilities. Due to the 35 picometre noise floor, it is ideal for researchers that need to visualise and measure nanometre or sub-nanometre-sized surface features. The system includes two optical microscopes. From the top, the HR AFM has a research grade video optical microscope with a 7:1 mechanical zoom, a 5 MP camera, and a coaxial light. With a resolution of < 2 microns, this microscope is ideal for locating features on a surface for scanning. The side view video microscope has a 2 mp camera and an off axis LED light source. This camera is used for visualizing the distance between the probe and the sample. This microscope is especially helpful for assisting probe approach on clear samples as well as samples that don’t reflect light. The HR AFM utilizes a unique probe holder/exchange mechanism. Probes are held in place with a spring device that mates with a probe exchange tool. This combination makes changing probes fast and easy.

Electronics in the HR AFM are constructed around industry-standard USB data acquisition electronics. The critical functions, such as XY scanning, are optimised with a 24-bit digital to analogue converter. With the analogue Z feedback loop, the highest fidelity scanning is possible. Vibrating mode scanning is possible with both phase and amplitude feedback using the high sensitivity phase detection electronics. Software for acquiring images is designed with the industry standard LabVIEW™ programming visual interface instrument design environment. There are many standard functions, including setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. LabVIEW™ facilitates rapid development for those users seeking to enhance the software with additional special features. LabVIEW also allows the HR AFM to be readily combined with any other instrument using LabVIEW.

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IONTOF M6 Hybrid SIMS

With the OrbitrapTM extension for the M6, IONTOF provides the first commercial SIMS instrument which combines the highest mass resolution (> 240,000) and highest mass accuracy (< 1 ppm) with high resolution cluster SIMS imaging.
The combination of the fast imaging capabilities of the TOF analyser with the unique performance of the OrbitrapTM for unambiguous peak identification provides a new level of SIMS information from organic samples.
The instrument extension also provides field-proven, high-end MS/MS capabilities and sets a benchmark for high resolution molecular SIMS applications.
The powerful combination of the gas cluster ion source and the OrbitrapTM analyser enables the distinction of different features even in highly complex organic samples.
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EnviroESCA

This novel and smart analysis tool overcomes the barriers of standard XPS systems by enabling analyses at pressures far above UHV. EnviroESCA is designed from the ground up for high-throughput analysis and opens up new applications in the fields of medical technology, biotechnology and the life sciences.

It offers the shortest loading-to-measurement time on samples of all types including liquids, tissue, plastics and foils, powders, soil, zeolites, rocks, minerals and ceramics

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ProvenX NAP

The SPECS ProvenX NAP is available with backfilling configuration or with In-Situ Cell (DeviSIM, like a small compact reactor). It is a performance optimised system for state of the art NAP-XPS as well as NAP-UPS measurements from UHV up to 30 mbar pressure range. It contains a PHOIBOS 150 NAP analyser with unsurpassed transmission and angular acceptance, a high performance small spot monochromatic X-ray source µ-FOCUS 600 NAP, a 4-axes manipulator or DeviSIM with NAP different heating capabilities as well as an optional non-monochromatic UV source UVS 300 NAP.

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AEOLOS 150 Analyser

Highest transmission wide angle hemispherical energy analyser with 60° acceptance angle, and AD-CMOS detector for photo electron spectroscopy measurements (XPS and UPS) and angular resolved studies (ARXPS) in the pressure regime from UHV to near ambient pressure (NAP upgradable). With this analyser NAP-HAXPES measurements up to 10 keV can be performed.

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